Sucher J, Boni R, Yang P, Rogowsky P, Kumlehn...

"Sucher J, Boni R, Yang P, Rogowsky P, Kumlehn...". (2016)

Sucher J, Boni R, Yang P, Rogowsky P, Kumlehn J, Krattinger SG, Keller B.
The durable wheat disease resistance gene Lr34 confers common rust and northern corn leaf blight resistance in maize. Plant Biotech J. [PMID : 27734576]

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