UMR 5182

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Characterization of solid and materials

Main equipments constituting the range of instruments available in the Chemistry Lab for materials characterization:

Dynamic Light scattering measuring devices (DLS, Dynamic Light Scattering) for determining the size (hydrodynamic diameter) of organic or inorganic particles suspended in different solvents and for measuring the zeta potential of particles. The range of measured sizes is 0.6 nm to 6 µm; the size range for which the zeta potential can be measured is 5 nm to 10 µm.

1 – MALVERN Zetasizer Nano ZS (red laser, 633 nm)

2 – Anton Paar Particle Analyzer LiteSizer 500, equipped with a titration module Metrohm 867 pH (red laser, 658 nm)

Thermogravimetric Analyzers (TGA). Instrument used to determine a material's thermal stability and its fraction of volatile components by monitoring the weight change that occurs as a sample is heated at a constant rate.

1 – TGA Model STA 409 PC/4/H Luxx. Works in a temperature range of 20° C to 1000° C, in different gaseous environments (air, O₂, N₂).

2 – TGA Setaram Labsys evo 1600°C, possibility to perform differential thermal analysis.

BET (Brunauer-Emmett-Teller) Surface Area Analysis. Model BELSORP-max. Nitrogen multilayer adsorption measured as a function of relative pressure. Determination of the specific surface area of a sample, measurement of pore size and pore volume.
Profilometer, DektakXT Bruker model (stylus profiler). Thickness and surface roughness measurement and characterization of thin films.
Rheometer, Kinexus Malvern model. Measurement of viscoelastic properties and flow behavior characterization of liquids and solids.
Ellipsometer Horiba Jobin Yvon (source 75 W) for the characterization of thin films (determination of thickness and of refractive index).
UV/Vis/NIR Spectrometer Perkin Elmer Lambda 750 (detector 60 mm InGaAs with integration sphere).
Infrared spectrometer Perkin Elmer Spectrum 65, equipped with an ATR (Attenuated Total Reflectance) module and transmission module.